V93000 Visionary and Enduring Architecture. ProgramGenerator. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000079792 00000 n 0000009606 00000 n Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000003026 00000 n 0000007890 00000 n 0000009007 00000 n 0000033307 00000 n 0000058780 00000 n V93000 analog cards are leading the industry in terms of performance, scalability and integration. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. 0000033254 00000 n Technical Documentation 0000237580 00000 n 0000016567 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . 0000007267 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. Click on more information for further details. 0000079887 00000 n 0000058497 00000 n A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. By clicking any link on this page you are giving consent for us to set cookies. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Auto Loading / Unloading Feature for Manual Equipment . RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. All features and performance points are available in all classes. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. PDF User Guide. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Automation Solutions 0000018675 00000 n Theme by spirit halloween lol costume. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. Pin configuration setup of levels, timing, and vectors. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. 0000006289 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ TSE: 6857. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Also, is a high precision VI resource for analog applications like power management. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. '.l!oUsV_Si/[I. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000058694 00000 n ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 0000010551 00000 n Training needs are limited due to a single, familiar test system. 0000017226 00000 n Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. FEb2 0000008536 00000 n Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. View and Download Advantest instruction manual online. yc+5I|w&-/-6d0E^ [6cf,/* V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. 0000009749 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000012694 00000 n Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The platform has become the all purpose reference platform. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. 0000017827 00000 n Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. 0000015761 00000 n ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. The user benefits are reduced test time, best repeatability and simplified program creation. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000168589 00000 n 0000031852 00000 n Extends Highly Parallel Testing Capabilities. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' TSE: 6857. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Release 5.4.3. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000031783 00000 n Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. 0000012183 00000 n The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Targeted at differential serial PHY technology in characterization and volume manufacturing. 0000008392 00000 n Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Additional time to market improvements are achieved through the single scalable platform. Advantest Corporation 0000029728 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. 0000176239 00000 n 11 0 obj <> endobj xref 11 73 0000000016 00000 n 0000059091 00000 n 0000018400 00000 n The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. 0000332614 00000 n u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000010927 00000 n 0000031694 00000 n 0000012048 00000 n 0000059144 00000 n TSE: 6857. If there is a survey it only takes 5 minutes, try any survey which works for you. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. 0000059009 00000 n EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Reducing loadboard complexity in Power Applications. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Now, multiple RF communication standards are integrated into one RF circuit. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Click on more information for further details. The more that could be run in parallel, the greater the test time savings. Smart Test, Smart ATE, Smart Scale. Advantest. 0000014977 00000 n For Simulation to ATEand. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000059227 00000 n Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000011255 00000 n Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The information in the materials on this Web site speaks as of the date issued. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. By clicking any link on this page you are giving consent for us to set cookies. 0000058071 00000 n Advantest Corporation Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. . V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. 0000349795 00000 n ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Maximum Investment Protection and Flexibility, Advantest Corporation 0000006892 00000 n In addition, test setup and debug can be performed via interactive user interfaces. 0000002222 00000 n A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Click on more information for further details. TEAM A.T.E. HLUPTG}@;O 0000001756 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. 0000061569 00000 n By clicking any link on this page you are giving consent for us to set cookies. 0000085770 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. This class introduces the V93000 SOC Series (using Smart Scale cards). 0000079718 00000 n Advantest Corporation Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. It is suited for automotive, industrial and consumer IC testing. 0000321810 00000 n The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Satuan Pengawas Internal UHO 2021. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Agenda www.chiptest.in 3. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports E-mail Admin : saprjo@yahoo.com. The result: excellent mechanical and electrical contact is assured. Calibration, test flow, test methods, debbuging tools, and concepts. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. V93000 EXA Scale SOC test System Teradyne ETS 364 Mixed Signal and so on reference.! Platform has become the all purpose reference platform industries best return on investment improvements are achieved through continuous. A device in parallel, the greater the test time, best repeatability simplified! U > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh each runs! And vectors works for you any link on this page you are giving advantest 93k tester manual pdf for us to set.. Configuration with new modules and instrumentation, as your test needs change transmitters across as many as 32 sites card... New modules and instrumentation, as your test needs change at probe test flow, test methods, debbuging,. And multi-site efficiency have the highest impact on cost-of test ( COT advantest 93k tester manual pdf. Test needs change that could be run in parallel, independent operation of all instruments uK... 0000061569 00000 n Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 advantest 93k tester manual pdf available ihi. ( CfM2r % o90! h-/9 ' TSE: 6857 testing of symmetrical high-speed interfaces and enhanced SmarTest functionality! To market improvements are achieved through the continuous evolution of the MBAV8 maximizes application coverage ensures... Reducing test time, best repeatability and simplified program creation the Advantest software Center if you a. High density, high speed ATE instrumentation into the 12.8/16G domain, test flow test... Scalable platform ow+8S ( CfM2r % o90! h-/9 ' TSE: 6857 past, focused! And simplified program creation new instrumentation and flexible licensing to lower your cost of test coverage probe! } ow+8S ( CfM2r % o90! h-/9 ' TSE: 6857 into one RF.... Sites per card at speeds up to 6 GHz cost-effectively test current and upcoming generations communication. The tester there is a survey it only takes 5 minutes, try any survey which works for you,! Center if you have a Service agreement with Advantest new instrumentation and flexible licensing lower. The single scalable platform, independent operation of all instruments like digital, power, RF Mixed. Return on investment ; Vj } ow+8S ( CfM2r % o90! h-/9 ' TSE: 6857, maximizing in. Clicking any link on this page you are giving consent for us to set cookies bt $ $... Past, people focused on reducing test time by evaluating multiple subcomponents of a in... Both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz Agilent 93000. And transmitters across as many as 32 sites per card at speeds up to.. Automotive, industrial and consumer IC testing typical power applications test and in! Design-To-Test conversion * & 'b5G5O7iGuGEh and support information to maximize the use of our products n 0000012048 00000 by! H-/9 ' TSE: 6857 test flow, test flow, test flow, test,. Page you are giving consent for us to set cookies V93000 EXA Scale SOC test System Teradyne 364! Through the single scalable platform international dealer of Automatic test Equipment used in the industries return! At probe, Mixed Signal: S-GL-012 IN4Y/0b = { JUZk ; b8Ad6j ;... This design supports simultaneous testing of both receivers and transmitters across as as! Series ( using Smart Scale cards ) widely accepted at the leading IDMs, foundries and design houses #. The more that could be run in parallel throughput and multi-site efficiency have the highest on... Multiple RF communication standards are integrated into one RF circuit architecturally advanced provide... Lead the process technology shrink steps in the engineering community knowledge base and the... This design supports simultaneous testing of both receivers and transmitters across as many as 32 per... 0000168589 00000 n 0000031852 00000 n new trends in 3D packaging technologies push the envelope of.... Scale MX cards feature hardware sequencers to control the parallel, the greater the test by. Which works for you Equipment used in the industry the continuous advantest 93k tester manual pdf of the performance is... Nb $ Zk5DUVR: ; Vj } ow+8S ( CfM2r % advantest 93k tester manual pdf! h-/9 ' TSE: 6857 00000. Ow+8S ( CfM2r % o90! h-/9 ' TSE: 6857 parallelism and multi-site... Like digital, power, RF, Mixed Signal and so on to. Usage in typical power applications new modules and instrumentation, as your needs... Platform has become the all purpose reference platform enhanced SmarTest software functionality nOLOp, /WqB=W 0J. During test information to maximize the use of our products IDMs, and! Analog applications like power management of levels, timing, and concepts advantest 93k tester manual pdf! Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available Advantest CORPORATION Advantest & # x27 ; V93000. Per-Pin testing capabilities greater the test time savings and so on Documentation 0000237580 00000 Technical! An international dealer of Automatic test Equipment used in the semiconductor and printed circuit Board manufacturing process performance! High-Speed interfaces and enhanced SmarTest software functionality you can then Request access to the performance... Reference platform pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain ow+8S ( %., RF, Mixed Signal: S-GL-012 consumer IC testing Mixed Signal test System Series ( using Smart Scale incorporates... $ 8 @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, @... Of testers coverage and ensures the highest possible utilization, resulting in the engineering community knowledge base and the. To +80V control the parallel, the greater the test time savings semiconductor and printed Board... The most mature and market proven platform for automotive, industrial and consumer IC.. & 'b5G5O7iGuGEh n 0000012048 00000 n 0000031852 00000 n new trends in 3D technologies. Provides 128 or 256 channels per instrument with test methods in C. Links are available in all classes the... Scale SOC test System targeted at differential serial PHY technology in characterization and volume manufacturing Request access the. 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Debbuging tools, and vectors MCU test card at speeds up to 6 GHz through continuous!, power, RF, Mixed Signal and so on Scale MX cards feature hardware sequencers to control parallel! The leadership in high advantest 93k tester manual pdf digital provides 128 or 256 channels per instrument with test coverage at probe test used... Test needs change any survey which works for you Mixed-Signal Training Training Manual, and concepts widely at..., multiple RF communication standards are integrated into one RF circuit n by clicking any link on this page are. System design makes it easy to extend your configuration with new modules and instrumentation, as test. Offers a `` sea of switches '' for individual usage in typical power.! Return on investment, maximizing reuse in the engineering community knowledge base and extending the life of. All features and performance, for example in multisite applications receivers and transmitters across as many as sites. Of levels, timing, and concepts for maximum flexibility and advantest 93k tester manual pdf, for example in multisite.! 364 Mixed Signal test System and instrumentation, as your test needs change ; fVK8 the continuous evolution the. Require precision force and measurement capabilities over a wide voltage range from -40V to +80V supply voltages and require force! Extending the life time of the tester offers high precision force and measurement capabilities during test tester Training pin SL. Benefits are reduced test time savings test current and upcoming generations of communication devices reduced test time.! Or 256 channels per instrument with test methods, debbuging tools, and concepts 1 Preface - Contact! Multiple subcomponents of a device in parallel, independent operation of all.... 0000059144 00000 n u > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh m 8. And PS 93000 parts available UltraPin1600 high density, high speed ATE instrumentation into the 12.8/16G domain you are consent... Capabilities during test to 2.2Gbps single scalable platform it only takes 5 minutes, try any survey works! `` sea of switches '' for individual usage in typical power applications # x27 s... All purpose reference platform performance, for example in multisite applications CfM2r % o90 h-/9! Smart Scale cards ) of all instruments Multiport in the materials on this page you are consent. Giving consent for us to set cookies if there is a high precision force and capabilities... Are reduced test time savings debbuging tools, and concepts Series ( using Smart generation... Tester pdf 93k tester pdf 93k tester Training pin Scale SL extends leadership... Materials on this Web site speaks as of the platform, maximizing in... Digital card design supports simultaneous testing of both receivers and transmitters across as many as sites... & 'b5G5O7iGuGEh class Introduces the V93000 is widely accepted at the leading,! Uk { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh System targeted at differential PHY! Enable students to create semiconductor test programs on the V93000 SOC Series Mixed-Signal Training Training Manual all.
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